Scanning Electron Microscope W filament (JEOL JSM-6400) and resolution of 3.5nm (in secondary electron mode and 30KV). Includes:
Secondary electron detector (topographic information)
Backscattered electron detector (compositional and crystal disorientation qualitative information)
INCA EDX detector X-sight Serie Si (Li) pentaFET Oxford with window (microanalytical data from Be) and data acquisition and processing energy INCA 350 that allows precise analysis, online and Map
2 WDX spectrometers with 2 glasses each JEOL (qualitative and quantitative microanalysis information)
Orion Acquisition of digital images,
Special Platina to work with lighting thru transparency as a microprobe.
Patterns are available for quantitative microanalysis of numerous materials and minerals.
SEM of Schottky field emission (JEOL JSM-7000F). Resolution in secondary electrons 1.2Nm at 30KV and 3 nm at 1 KV. 3nm resolution electron backscattered to 15KV and 10mm working distance. The accelerating voltage is variable between 0.5KV and 30KV and the beam current is 1 Picoa and 200nA. Includes:
secondary electron detector (topographic information)
Backscattered electron detector (compositional and crystal disorientation qualitative information)
INCA EDX detector X-sight Serie Si (Li) pentaFET Oxford with window (microanalytical data from Be) and data acquisition and processing energy INCA 350 that allows precise analysis, online and Map
EBSD detector premium HKL Nordlys II (crystallographic information). They are included in the Channel 5 software both databases HKL, PDF2, geological and NIST as software data acquisition and processing: Twist, Mambo, Tango, Salsa, Flamenco, Map Stitcher
Patterns are available for quantitative microanalysis of numerous materials and minerals.
GSR software for analysis of shot particles.
SEM-FIB (FEI Helios Nanolab 650). Resolution at the point of coincidence of 4.5Nm. Ion beam current to 65nA. Includes:
5 gas injectors for deposition of Pt, W, C, an insulator (TEOS) and an etching gas (XeF2).
Omniprobe micromanipulator AutoProbe 200.2 for the extraction of lamellae
Secondary electron detectors and backscattered to acquire thru electrons the image of the sample surface.
Ion detector can acquire both the image given by the ions as well as secondary electrons.
STEM Detector (it shows the image in transmission of samples thinned with ion beam).
EDX microanalysis system Aztec Energy 350 Oxford dry detector whose resolution is 124eV (allows microanalysis of samples).
Electron micrographs of ultra-high resolution field emission type Schottky X-FEG (FEI Titan 60-300 Cubed G2 with monochromator and CEOS aberration correction to the third order in the SuperTwin objective lens) that works both in transmission mode as in scanning-transmission. Resolution point to point ≤ 0.07nm for 300kV and ≤ 0.11nm for 80kV . Resolution STEM mode ≤ 0.136nm for 300kV. Energy resolution ≤ 0.3EV. inclination within ± 35º and 30º ± b Includes:
Alignments at 80, 200 and 300kV.
Gatan camera 2Kx2K US1000XP-P.
HAADF detector (Fischione) and brightfield and darkfield FEI.
EDX detector Super-X (ChemiSTEM technology acquisition and data processing by the ESPRIT Bruker software).
Gatan energy filter Quantum ER/965 P with Gatan camera 2Kx2K post filter.
Lorentz lens.
Sample carrier simple acquisition.
Analytical double tilt sample holder.
Simple tilt sample holder for scanning.
Software acquisition in both TEM and STEM mode for scanning, INSPECT 3D software for alignment and reconstruction. Y Resolve RT FEI for visualization. Treatment of reconstruction and visualization is done off line on another computer.
Acquisition system of precession of electrons.
True Image software for acquisition and reconstruction of series of focus.
Traditional systems for sample preparation and scanning transmission and mechanical thinning Pulido
Electrolytic polishing and thinning
Pulido sputter
Carbon evaporators, Au and other metals
Off line Computer Programs for data processing: Carine, JEMS, TIA, Gatan Digital Micrograph, True Image
nireEHU 