Subject
RF and Microwave Measurement Technique
General details of the subject
- Mode
- Face-to-face degree course
- Language
- English
Description and contextualization of the subject
Comprender los fundamentos de las técnicas y sistemas de medición de RF y microondas. Adquirir práctica en el uso de equipos de microondas.Teaching staff
| Name | Institution | Category | Doctor | Teaching profile | Area | |
|---|---|---|---|---|---|---|
| BADILLO FERNANDEZ, INARI | University of the Basque Country | Profesorado Agregado | Doctor | Bilingual | Electronics | inari.badillo@ehu.eus |
| COLLANTES METOLA, JUAN MARIA | University of the Basque Country | Profesorado Catedratico De Universidad | Doctor | Not bilingual | Electronics | juanmari.collantes@ehu.eus |
| OTEGI URDANPILLETA, NEREA | University of the Basque Country | Profesorado Agregado | Doctor | Bilingual | Electronics | nerea.otegi@ehu.eus |
Study types
| Type | Face-to-face hours | Non face-to-face hours | Total hours |
|---|---|---|---|
| Lecture-based | 20 | 25 | 45 |
| Applied laboratory-based groups | 25 | 42.5 | 67.5 |
Training activities
| Name | Hours | Percentage of classroom teaching |
|---|---|---|
| Autonomous work | 67.5 | 0 % |
| Classroom/Seminar/Workshop | 20.0 | 100 % |
| Laboratory/Field | 25.0 | 100 % |
Assessment systems
| Name | Minimum weighting | Maximum weighting |
|---|---|---|
| Application of theoretical materials in practice | 40.0 % | 60.0 % |
| Written examination | 40.0 % | 60.0 % |
Learning outcomes of the subject
Knowledge or content:RCO4 - Understanding and handling high-frequency characterization equipment.
Competencies:
RC1 - Being able to analyze high-frequency passive and active circuits.
Abilities or skills:
RHE1 - Being able to think analytically.
RHE2 - Being able to analyze and solve technical problems.
RHT2 - Being able to design and characterize high-frequency passive devices for various applications.
RHT4 - Being able to work practically with basic equipment for RF and microwave measurements.
Temary
1 - Revisión de las figuras de mérito a nivel de circuito y a nivel de sistema.2 - Instrumentos básicos: Medidores de potencia, Analizadores de espectro, Analizadores vectoriales de señales, Analizadores vectoriales de redes, Analizadores vectoriales de redes no lineales, Osciloscopios y medidas en el dominio del tiempo y Medidores de figura de ruido.
3 - Instrumentación modular.
4 - Setups de medida (medidas IMD, Load-Pull activo y pasivo, I-V pulsado, etc.).
Bibliography
Basic bibliography
- N. Borges, D. Schreurs, Microwave and Wireless Measurement Techniques, Cambridge University Press, 2013- V. Teppati, A. Ferrero, M. Sayed, Modern RF and Microwave Measurement Techniques, Cambridge University Press, 2013
- R.J. Collier and A.D. Skinner (Ed.), Microwave Measurements, IET, 2007, London.
- Exploring the Architectures of VNAs, Agilent Application Note 1287-2.
- Applying Error Correction to Network Analyzer Measurements, Agilent Application Note 1287-3.