Subject
Experimental Techniques I: Structural Characterization
General details of the subject
- Mode
- Face-to-face degree course
- Language
- English
Description and contextualization of the subject
This subject provides the students with the necessary knowledge to understand the basic experimental methods for structural characterization, including microscopies and diffraction techniques. The focus is put on those more used for nanoscale charactriazation.Teaching staff
Name | Institution | Category | Doctor | Teaching profile | Area | |
---|---|---|---|---|---|---|
ALEGRIA LOINAZ, ANGEL MARIA | University of the Basque Country | Profesorado Catedratico De Universidad | Doctor | Not bilingual | Applied Physics | angel.alegria@ehu.eus |
FERNANDEZ ALONSO, FELIX | Otras universidades extranjeras | Doctor | ||||
MAESTRO MARTIN, ARMANDO | MPC- Materials Physics Center | Otros | Doctor | armando.maestro@ehu.eus |
Competencies
Name | Weight |
---|---|
Que los estudiantes conozcan los fundamentos de las distintas técnicas de microsopias para la caracterización estructural | 50.0 % |
Que los estudiantes conozcan los fundamentos de las técnicas de difracción para la caracterización estructural | 50.0 % |
Study types
Type | Face-to-face hours | Non face-to-face hours | Total hours |
---|---|---|---|
Lecture-based | 18 | 33 | 51 |
Applied laboratory-based groups | 12 | 12 | 24 |
Training activities
Name | Hours | Percentage of classroom teaching |
---|---|---|
Lectures | 18.0 | 0 % |
Practical activities on the preparation and characterisation of materials and devices (guided practice) | 12.0 | 0 % |
Assessment systems
Name | Minimum weighting | Maximum weighting |
---|---|---|
Multiple-choice examination | 100.0 % | 100.0 % |
Ordinary call: orientations and renunciation
Final evaluation: 100% theoretical-practical exam.In case the student does not show up at the final exam, he/she will be considered as not presented.
Extraordinary call: orientations and renunciation
Final evaluation: 100% theoretical-practical exam.In case the student does not show up at the final exam, he/she will be considered as not presented.
Temary
PART 1 – MICROSCOPIES1.1 INTRODUCTION: MEASURING AT THE NANOSCALE
1.2 THE LIMITS OF OPTICAL MICROSCOPY. CONFOCAL MICROSCOPY
1.3 ELECTRON MICROSCOPIES. TRANSMISSION ELECTRON MICROSCOPY, SCANNING ELECTRON MICROSCOPY
1.4 SCANNING PROBE MICROSCOPY: PRINCIPLES OF OPERATION. TUNNELLING MICROSCOPY,
1.5 ATOMIC FORCE MICROSCOPY. BASIC PRINCIPLES AND MULTIMODE OPERATION.
PART 2 – SCATTERING TECHNIQUES
2.1 BASIC NOTIONS: SCATTERING, INTERFERENCE & DIFFRACTION
2.2 EXPERIMENTAL TECHNIQUES – NEUTRONS AND X-RAYS
2.3 WIDE-ANGLE DIFFRACTION
2.4 SMALL-ANGLE SCATTERING
Bibliography
Basic bibliography
1- ROBERT H WEBB, CONFOCAL OPTICAL MICROSCOPY, REP. PROG. PHYS. 59 (1996) 427¿4712.- E. MEYER, H. J. HUG AND R. BENNEWITZ, SCANNING PROBE MICROSCOPY: THE LAB ON A TIP, SPRINGER VERLAG.
3.- THE NANOTECHNOLOGY MULTIMEDIA ENCYCLOPEDIC COURSES, EXPLORING NANOTECHNOLOGY, NANOPOLIS.
4.- SCANNING PROBE MICROSCOPY. THE LAB ON A TIP. E. MEYER, H.J. HUG, R. BENNEWITZ. SPRINGER
5.- J. P. EBERHART, STRUCTURAL AND CHEMICAL ANALISYS OF MATERIALS: X-RAY, ELECTRON AND NEUTRON DIFFRACTION - X-RAY, ELECTRON AND ION SPECTROMETRY, ELECTRON MICROSCOPY, WILEY, 1991
6.- R.-J. ROE, METHODS OF X-RAY AND NEUTRON SCATTERING IN POLYMER SCIENCE, OXFORD UNIVERSITY PRESS, 2000.
7.- C. HAMMOND, THE BASICS OF CRYSTALLOGRAPHY AND DIFFRACTION 2nd EDITION, OXFORD SCIENCE PUBLICATIONS, 2002.
In-depth bibliography
J. ALS-NIELSEN AND D. MCMORROW, ELEMENTS OF MODERN X-RAY PHYSICS, 2nd EDITION, WILEY, 2011.F. FERNANDEZ-ALONSO AND D.L. PRICE, NEUTRON SCATTERING – FUNDAMENTALS, ACADEMIC PRESS, 2013.
F. FERNANDEZ-ALONSO AND D.L. PRICE, NEUTRON SCATTERING – MAGNETIC AND QUANTUM PHENOMENA, ACADEMIC PRESS, 2015.
F. FERNANDEZ-ALONSO AND D.L. PRICE, NEUTRON SCATTERING – APPLICATIONS IN BIOLOGY, CHEMISTRY, AND MATERIALS SCIENCE, ACADEMIC PRESS, 2017.