Subject
Experimental Techniques I: Structural Characterization
General details of the subject
- Mode
- Face-to-face degree course
- Language
- English
Description and contextualization of the subject
This subject provides the students with the necessary knowledge to understand the basic experimental methods for structural characterization, including microscopies and diffraction techniques. The focus is put on those more used for nanoscale charactriazation.Teaching staff
| Name | Institution | Category | Doctor | Teaching profile | Area | |
|---|---|---|---|---|---|---|
| ALEGRIA LOINAZ, ANGEL MARIA | University of the Basque Country | Profesorado Catedratico De Universidad | Doctor | Not bilingual | Applied Physics | angel.alegria@ehu.eus |
| MARTINEZ TONG, DANIEL ENRIQUE | University of the Basque Country | Investigador (Doctor) | Doctor | Not bilingual | ** n o c o n s t a e l a r e a * ó " á r e a p r o v i s i o n a l" | danielenrique.martinezt@ehu.eus |
| ARBE MENDEZ, MARIA ARANZAZU | Centro de Física de Materiales CSIC | Otros | Doctor | mariaaranzazu.arbe@ehu.eus |
Competencies
| Name | Weight |
|---|---|
| Que los estudiantes conozcan los fundamentos de las distintas técnicas de microsopias para la caracterización estructural | 50.0 % |
| Que los estudiantes conozcan los fundamentos de las técnicas de difracción para la caracterización estructural | 50.0 % |
Study types
| Type | Face-to-face hours | Non face-to-face hours | Total hours |
|---|---|---|---|
| Lecture-based | 18 | 33 | 51 |
| Applied laboratory-based groups | 12 | 12 | 24 |
Assessment systems
| Name | Minimum weighting | Maximum weighting |
|---|---|---|
| Multiple-choice examination | 100.0 % | 100.0 % |
Ordinary call: orientations and renunciation
Final evaluation: 100% theoretical-practical exam.In case the student does not show up at the final exam, he/she will be considered as not presented.
Extraordinary call: orientations and renunciation
Final evaluation: 100% theoretical-practical exam.In case the student does not show up at the final exam, he/she will be considered as not presented.
Temary
Lecture 1 INTRODUCTION: MEASURING AT THE NANOSCALELecture 2 THE LIMITS OF OPTICAL MICROSCOPY. CONFOCAL MICROSCOPY
Lecture 3 ELECTRON MICROSCOPIES. TRANSMISSION ELECTRON MICROSCOPY, SCANNING ELECTRON MICROSCOPY
Lecture 4 SCANNING PROBE MICROSCOPY: PRINCIPLES OF OPERATION. TUNNELLING MICROSCOPY,
Lecture 5 ATOMIC FORCE MICROSCOPY. BASIC PRINCIPLES AND MULTIMODE OPERATION.
Lecture 6 DIFFRACTION TECHNIQUES: INTRODUCTION TO DIFFRACTION
Lecture 7 WIDE ANGLE X-RAY DIFFRACTION
Lecture 8 SMALL ANGLE X-RAY DIFFRACTION
Bibliography
Basic bibliography
1- ROBERT H WEBB, CONFOCAL OPTICAL MICROSCOPY, REP. PROG. PHYS. 59 (1996) 427¿4712.- E. MEYER, H. J. HUG AND R. BENNEWITZ ¿SCANNING PROBE MICROSCOPY: THE LAB ON A TIP¿, SPRINGER VERLAG.
3.- THE NANOTECHNOLOGY MULTIMEDIA ENCYCLOPEDIC COURSES, ¿EXPLORING NANOTECHNOLOGY¿ NANOPOLIS.
4.- SCANNING PROBE MICROSCOPY. THE LAB ON A TIP. E. MEYER, H.J. HUG, R. BENNEWITZ. SPRINGER
5.- J. P. EBERHART ¿STRUCTURAL AND CHEMICAL ANALISYS OF MATERIALS: X-RAY, ELECTRON AND NEUTRON DIFFRACTION - X-RAY, ELECTRON AND ION SPECTROMETRY ¿ ELECTRON MICROSCOPY¿, WILEY, 1991
6.- ¿INTERNATIONAL TABLES FOR CRYSTALLOGRAPHY¿, KLUWER, 1995.
7.- H. P. KLUG AND L. E. ALEXANDER ¿X-RAY DIFFRACTION PROCEDURES FOR POLYCRYSTALLINE AND AMORPHOUS MATERIALS¿, WILEY, 1974.
In-depth bibliography
1- ROBERT H WEBB, CONFOCAL OPTICAL MICROSCOPY, REP. PROG. PHYS. 59 (1996) 427¿4712.- E. MEYER, H. J. HUG AND R. BENNEWITZ ¿SCANNING PROBE MICROSCOPY: THE LAB ON A TIP¿, SPRINGER VERLAG.
3.- THE NANOTECHNOLOGY MULTIMEDIA ENCYCLOPEDIC COURSES, ¿EXPLORING NANOTECHNOLOGY¿ NANOPOLIS.
4.- SCANNING PROBE MICROSCOPY. THE LAB ON A TIP. E. MEYER, H.J. HUG, R. BENNEWITZ. SPRINGER
5.- J. P. EBERHART ¿STRUCTURAL AND CHEMICAL ANALISYS OF MATERIALS: X-RAY, ELECTRON AND NEUTRON DIFFRACTION - X-RAY, ELECTRON AND ION SPECTROMETRY ¿ ELECTRON MICROSCOPY¿, WILEY, 1991