Subject

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Experimental Techniques I: Structural Characterization

General details of the subject

Mode
Face-to-face degree course
Language
English

Description and contextualization of the subject

This subject provides the students with the necessary knowledge to understand the basic experimental methods for structural characterization, including microscopies and diffraction techniques. The focus is put on those more used for nanoscale charactriazation.

Teaching staff

NameInstitutionCategoryDoctorTeaching profileAreaE-mail
ALEGRIA LOINAZ, ANGEL MARIAUniversity of the Basque CountryProfesorado Catedratico De UniversidadDoctorNot bilingualApplied Physicsangel.alegria@ehu.eus
MARTINEZ TONG, DANIEL ENRIQUEUniversity of the Basque CountryInvestigador (Doctor)DoctorNot bilingual** n o c o n s t a e l a r e a * ó " á r e a p r o v i s i o n a l"danielenrique.martinezt@ehu.eus
ARBE MENDEZ, MARIA ARANZAZUCentro de Física de Materiales CSICOtrosDoctormariaaranzazu.arbe@ehu.eus

Competencies

NameWeight
Que los estudiantes conozcan los fundamentos de las distintas técnicas de microsopias para la caracterización estructural50.0 %
Que los estudiantes conozcan los fundamentos de las técnicas de difracción para la caracterización estructural50.0 %

Study types

TypeFace-to-face hoursNon face-to-face hoursTotal hours
Lecture-based183351
Applied laboratory-based groups121224

Assessment systems

NameMinimum weightingMaximum weighting
Multiple-choice examination100.0 % 100.0 %

Ordinary call: orientations and renunciation

Final evaluation: 100% theoretical-practical exam.

In case the student does not show up at the final exam, he/she will be considered as not presented.

Extraordinary call: orientations and renunciation

Final evaluation: 100% theoretical-practical exam.

In case the student does not show up at the final exam, he/she will be considered as not presented.

Temary

Lecture 1 INTRODUCTION: MEASURING AT THE NANOSCALE

Lecture 2 THE LIMITS OF OPTICAL MICROSCOPY. CONFOCAL MICROSCOPY

Lecture 3 ELECTRON MICROSCOPIES. TRANSMISSION ELECTRON MICROSCOPY, SCANNING ELECTRON MICROSCOPY

Lecture 4 SCANNING PROBE MICROSCOPY: PRINCIPLES OF OPERATION. TUNNELLING MICROSCOPY,

Lecture 5 ATOMIC FORCE MICROSCOPY. BASIC PRINCIPLES AND MULTIMODE OPERATION.

Lecture 6 DIFFRACTION TECHNIQUES: INTRODUCTION TO DIFFRACTION

Lecture 7 WIDE ANGLE X-RAY DIFFRACTION

Lecture 8 SMALL ANGLE X-RAY DIFFRACTION



Bibliography

Basic bibliography

1- ROBERT H WEBB, CONFOCAL OPTICAL MICROSCOPY, REP. PROG. PHYS. 59 (1996) 427¿471

2.- E. MEYER, H. J. HUG AND R. BENNEWITZ ¿SCANNING PROBE MICROSCOPY: THE LAB ON A TIP¿, SPRINGER VERLAG.

3.- THE NANOTECHNOLOGY MULTIMEDIA ENCYCLOPEDIC COURSES, ¿EXPLORING NANOTECHNOLOGY¿ NANOPOLIS.

4.- SCANNING PROBE MICROSCOPY. THE LAB ON A TIP. E. MEYER, H.J. HUG, R. BENNEWITZ. SPRINGER

5.- J. P. EBERHART ¿STRUCTURAL AND CHEMICAL ANALISYS OF MATERIALS: X-RAY, ELECTRON AND NEUTRON DIFFRACTION - X-RAY, ELECTRON AND ION SPECTROMETRY ¿ ELECTRON MICROSCOPY¿, WILEY, 1991

6.- ¿INTERNATIONAL TABLES FOR CRYSTALLOGRAPHY¿, KLUWER, 1995.

7.- H. P. KLUG AND L. E. ALEXANDER ¿X-RAY DIFFRACTION PROCEDURES FOR POLYCRYSTALLINE AND AMORPHOUS MATERIALS¿, WILEY, 1974.

In-depth bibliography

1- ROBERT H WEBB, CONFOCAL OPTICAL MICROSCOPY, REP. PROG. PHYS. 59 (1996) 427¿471



2.- E. MEYER, H. J. HUG AND R. BENNEWITZ ¿SCANNING PROBE MICROSCOPY: THE LAB ON A TIP¿, SPRINGER VERLAG.



3.- THE NANOTECHNOLOGY MULTIMEDIA ENCYCLOPEDIC COURSES, ¿EXPLORING NANOTECHNOLOGY¿ NANOPOLIS.



4.- SCANNING PROBE MICROSCOPY. THE LAB ON A TIP. E. MEYER, H.J. HUG, R. BENNEWITZ. SPRINGER



5.- J. P. EBERHART ¿STRUCTURAL AND CHEMICAL ANALISYS OF MATERIALS: X-RAY, ELECTRON AND NEUTRON DIFFRACTION - X-RAY, ELECTRON AND ION SPECTROMETRY ¿ ELECTRON MICROSCOPY¿, WILEY, 1991

Links

http://dipc.ehu.es/mscnano/intranet/ETI/

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